The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Dec. 13, 2017
Applicant:

Airex Co., Ltd., Nagoya, JP;

Inventors:

Koji Kawasaki, Nagoya, JP;

Haruka Hutamura, Nagoya, JP;

Yukihiro Yazaki, Nagoya, JP;

Zhiqiang Guo, Nagoya, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
C12M 41/36 (2013.01); G01N 21/64 (2013.01);
Abstract

The present invention provides a microorganism inspection system that is capable of instantly inspecting individual containers for microorganism contamination of the containers that are filled with or accommodate medicines and the like. The present invention has a supply means for supplying a predetermined amount of clean air to the inside or the outer surface of a container, a collecting means for collecting the air supplied to the container by the supply means, and a detecting means for detecting microorganisms included in the air collected by the collecting means.


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