The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Jul. 07, 2017
Eos Gmbh Electro Optical Systems, Krailling, DE;
Robert Achim Domröse, Germering, DE;
Pilvi Ylander, Turku, FI;
Katri Kakko, Turku, FI;
Kevin Minet, Turku, FI;
Tatu Syvänen, Preitilä, FI;
Dominik Wolf, Munich, DE;
EOS GmbH Electro Optical Systems, Krailling, DE;
Abstract
Disclosed is a method of determining a quality indicator of an object that has been manufactured by layer-wise additive manufacturing. The method includes providing a first dataset that is assigned to a process monitoring device, detecting a relative frequency of occurrence of a process irregularity in a layer and of assigning a grade indicator value to the solidified object cross-section in a layer according to the detected relative frequency, generating a second dataset, in which a grade indicator value is assigned to the object cross-section in each of said several layers following upon one another, and determining a quality indicator by using the second dataset (or several further datasets).