The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Oct. 11, 2017
Applicant:
Windmöller & Hölscher KG, Lengerich, DE;
Inventors:
Torsten Schmitz, Greven, DE;
Daniel Faustmann, Georgsmarienhutte, DE;
Bernd-Alexander Groepper, Drensteinfurt, DE;
Assignee:
WINDMÖLLER & HÖLSCHER KG, Lengerich, DE;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 48/92 (2019.01); B29C 48/08 (2019.01); B29C 48/88 (2019.01); B29L 7/00 (2006.01); B29C 41/26 (2006.01);
U.S. Cl.
CPC ...
B29C 48/92 (2019.02); B29C 41/26 (2013.01); B29C 48/08 (2019.02); B29C 48/914 (2019.02); B29C 2948/92209 (2019.02); B29C 2948/92295 (2019.02); B29L 2007/008 (2013.01);
Abstract
The invention relates to a method for monitoring a film quality in the production of a plastic film, comprising the following steps: —determining a first temperature () of a film material () of the plastic film during a transport of the film material (), in which the film material () is cooled along a conveying direction () of the film material (). The invention further relates to a film machine () comprising a device for monitoring a film quality in the production of a plastic film.