The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Dec. 13, 2019
General Electric Company, Schenectady, NY (US);
Biju Jacob, Niskayuna, NY (US);
Mingye Wu, Glenville, NY (US);
Mark Allen Adamak, Wauwatosa, WI (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
The techniques disclosed may be used to detect and correct channel gain errors resulting from X-ray focal spot mis-alignment during the course of a scan. One benefit of the present invention relative to conventional techniques is that additional hardware is not required for detection of focal spot drift. Instead, the static mis-alignment of each blade is taken into account as part of estimating and correcting X-ray focal spot drift or mis-alignment. In this manner, the risk of image artefacts due to focal spot motion is reduced and the need for costly hardware solutions to detect focal spot motion is avoided.