The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Oct. 22, 2019
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Hyoseok Hwang, Seoul, KR;
Yang Ho Cho, Seongnam-si, KR;
Dong Kyung Nam, Yongin-si, KR;
Ouk Choi, Yongin-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2018.01); H04N 13/133 (2018.01); H04N 13/246 (2018.01); H04N 13/257 (2018.01); G06T 7/33 (2017.01); H04N 13/15 (2018.01); H04N 13/128 (2018.01); G06T 3/00 (2006.01); H04N 13/25 (2018.01);
U.S. Cl.
CPC ...
H04N 13/133 (2018.05); G06T 3/0093 (2013.01); G06T 7/33 (2017.01); H04N 13/128 (2018.05); H04N 13/15 (2018.05); H04N 13/246 (2018.05); H04N 13/257 (2018.05); G06T 2207/10012 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20024 (2013.01); H04N 13/25 (2018.05);
Abstract
An apparatus for calibrating a multiview image may extract feature points from the multiview image and perform image calibration based on the extracted feature points, track corresponding feature points in temporally successive image frames of a first view image, and perform the image calibration based on pairs of corresponding feature points between the feature points tracked from the first view image and feature points of a second view image.