The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Feb. 04, 2019
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Kei Kodera, Kyoto, JP;
Hideharu Shichi, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/10 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0418 (2013.01); H01J 49/0004 (2013.01); H01J 49/10 (2013.01);
Abstract
The invention provides a matrix observation device where a location to be irradiated with a laser beam that provides high efficiency of the ionization can be found from among sample spots arranged on a sample plate. The device is formed of: a stageon which a sample plateon which a sample is to be arranged is to be placed; a light source unitthat emits ultraviolet rays for observation with which the sample plateis irradiated; and an image acquisition unitfor detecting light from the sample plateso as to create an optical image, and the sample contains a matrix that absorbs the ultraviolet rays for observation.