The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Jul. 18, 2017
Applicant:

Analytics for Life Inc., Kingston, CA;

Inventors:

Paul Grouchy, Toronto, CA;

Timothy Burton, Ottowa, CA;

Ali Khosousi, Toronto, CA;

Abhinav Doomra, North York, CA;

Sunny Gupta, Toronto, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 99/00 (2019.01); G16H 50/20 (2018.01); G06K 9/00 (2006.01); G06F 16/56 (2019.01); G16B 40/00 (2019.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06N 20/00 (2019.01); G06F 17/00 (2019.01); G06F 19/00 (2018.01);
U.S. Cl.
CPC ...
G16B 40/00 (2019.02); G06N 3/04 (2013.01); G06N 3/086 (2013.01); G06N 20/00 (2019.01); G06F 17/00 (2013.01); G06F 19/00 (2013.01);
Abstract

A facility providing systems and methods for discovering novel features to use in machine learning techniques. The facility receives, for a number of subjects, one or more sets of data representative of some output or condition of the subject over a period of time or capturing some physical aspect of the subject. The facility then extracts or computes values from the data and applies one or more feature generators to the extracted values. Based on the outputs of the feature generators, the facility identifies novel feature generators for use in at least one machine learning process and further mutates the novel feature generators, which can then be applied to the received data to identify additional novel feature generators.


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