The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Dec. 10, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Ayu Karasudani, Yamato, JP;

Atsunori Moteki, Inagi, JP;

Kensuke Kuraki, Ichikawa, JP;

Toshiyuki Yoshitake, Kawasaki, JP;

Mitsuhiro Makita, Sagamihara, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/543 (2017.01); G06T 11/20 (2006.01); G06T 1/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/75 (2017.01); G06T 7/543 (2017.01); G06T 7/74 (2017.01); G06T 11/203 (2013.01);
Abstract

A processor detects feature lines from an image of an object and generates projection lines by projecting line segments in shape information of the object on the image. The processor generates combinations each including a feature line and a projection line and generates plural sets each including a specific number of combinations. The processor uses each set to estimate a position and an orientation of an imaging device that has captured the image, and evaluates a result of the estimation for each set. When there is a change in a relative position or orientation between the object on the image and a shape represented by the shape information, the processor repeats generation of the plural sets, estimation of the position and the orientation of the imaging device and evaluation of the estimation result. The processor determines the position and the orientation of the imaging device based on the repeated evaluation.


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