The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Aug. 21, 2018
Fussen Technology Co., Ltd., Shenzhen, CN;
Minfeng Chen, Shenzhen, CN;
Jing Lei, Shenzhen, CN;
FUSSEN TECHNOLOGY CO., LTD., Shenzhen, CN;
Abstract
A method for visible cephalometric measurement is provided. The method comprises: acquiring a data item to be measured according to a preset analysis method, and acquiring preset reference information; determining a measurement reference point according to the acquired preset reference information; and generating a measurement result based on the measurement reference point and the data item to be measured, and displaying it. A computer processing device and a visible cephalometric system are also provided. The computer may automatically generate measurement results according to user's selection and perform cephalometric measurement more easily, accurately, and more efficiently.