The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Apr. 16, 2020
Align Technology, Inc., San Jose, CA (US);
Anatoliy Parpara, Moscow, RU;
Ivan Kharpalev, Tver, RU;
Stephan Albert Alexandre Dumothier, Houston, TX (US);
Andrey Cherkas, Krasnoznamensk, RU;
Alexey Kalinichenko, Cary, NC (US);
Jack Shaw, Durham, NC (US);
Israel Velazquez, Juarez, MX;
Align Technology, Inc., San Jose, CA (US);
Abstract
A system for inspecting a customized dental device associated with a dental application for manufacturing defects is disclosed. The system obtains images of the customized device and identifies an identifier of the customized device. The system determines a digital file associated with the customized device based on the identifier, the digital file including a first digital model of the customized device and/or a second digital model of a mold used during manufacture of the customized device. The system determines an intended property for the customized device based on at least one of the first digital model or the second digital model, determines an actual property of the customized device from the images, determines whether there is a manufacturing defect in the customized device by comparing the intended property for the customized device with the actual property of the customized device, and outputs an output associated with the determination.