The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Dec. 19, 2019
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Theodore J. Sergesketter, West Lafayette, IN (US);

Nathan Alphonse Secinaro, Seattle, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 19/20 (2011.01); G06T 15/00 (2011.01); G06T 7/62 (2017.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/62 (2017.01); G06T 11/206 (2013.01); G06T 15/00 (2013.01); G06T 19/20 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20072 (2013.01); G06T 2207/30136 (2013.01); G06T 2219/008 (2013.01);
Abstract

A method for three-dimensional (3D) inspection of a workpiece for conformance to a specification includes scanning, by a 3D optical scanning device, a hole formed in a workpiece to generate a 3D point cloud of the hole defined in a 3-axis coordinate system of the 3D optical scanning device. The 3D point cloud includes 3D point cloud data that provides a profile of the hole. The method also includes translating the 3D point cloud data to generate translated 3D point cloud data that facilitates analysis of the 3D point cloud. The method further includes performing analysis of the hole using the translated 3D point cloud data to determine conformance of the hole with a specification and to detect anomalies associated with the hole.


Find Patent Forward Citations

Loading…