The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Jun. 28, 2019
Applied Underwriters, Inc., Omaha, NE (US);
Justin N. Smith, Woodside, CA (US);
Christine Cai, Cupertino, CA (US);
Mark S. Nowotarski, Stamford, CT (US);
Applied Underwriters, Inc., Omaha, NE (US);
Abstract
A statistical facility event monitor has a computer implemented event percentile meter. The event percentile meter counts the number of randomly initiated events that cause a monitored facility to consume a monitored utility over a monitored time period. The event percentile meter then calculates a cumulative distribution function for the randomly initiated events. The event percentile meter uses the cumulative distribution to determine the event percentile for the monitored facility. The event percentile meter then outputs the event percentile.