The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Mar. 23, 2017
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventors:

Luhui Hu, Bellevue, WA (US);

Hui Zang, Santa Clara, CA (US);

Ziang Hu, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

An apparatus and method are provided for review-based machine learning. Included are a non-transitory memory storing instructions and one or more processors in communication with the non-transitory memory. The one or more processors execute the instructions to receive first data, generate a plurality of first features based on the first data, and identify a first set of labels for the first data. A first model is trained using the first features and the first set of labels. The first model is reviewed to generate a second model, by receiving a second set of labels for the first data, and reusing the first features with the second set of labels in connection with training the second model.


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