The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Apr. 22, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventor:

Hiroya Inakoshi, Tama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/9538 (2019.01); G06F 16/909 (2019.01); G06F 16/951 (2019.01);
U.S. Cl.
CPC ...
G06F 16/9538 (2019.01); G06F 16/909 (2019.01); G06F 16/951 (2019.01);
Abstract

A storage medium storing a program that causes a processor to execute for acquiring distribution data indicating a distribution of spots in an area to be searched, and area data indicating positions of divided areas obtained by dividing the area to be searched; generating an adjacency matrix indicating an adjacency relation between the divided areas from the area data; generating an evaluation function for evaluating selection of the divided areas using: a variable indicating selection of consecutive divided areas, the distribution data, and the adjacency matrix; calculating a gradient of a value of the evaluation function from a current value of the variable; executing a gradient method search for updating the value of the variable using the calculated gradient; and determining selection of the divided areas as an optimal area for event occurrence analysis based on a result of the gradient method search.


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