The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
May. 03, 2019
Emc Ip Holding Company, Llc, Hopkinton, MA (US);
Sorin Faibish, Newton, MA (US);
Philip Shilane, Newtown, PA (US);
Ivan Basov, Brookline, MA (US);
Istvan Gonczi, Berkley, MA (US);
Vamsi Vankamamidi, Hopkinton, MA (US);
EMC IP Holding Company, LLC, Hopkinton, MA (US);
Abstract
A method, computer program product, and computing system for performing an entropy analysis on each of a plurality of candidate data chunks associated with a potential candidate to generate a plurality of candidate data chunk entropies; performing an entropy analysis on each of a plurality of target data chunks associated with a potential target to generate a plurality of target data chunk entropies; identifying a candidate data chunk entropy limit, chosen from the plurality of candidate data chunk entropies, and a target data chunk entropy limit, chosen from the plurality of candidate data chunk entropies; and comparing a specific candidate data chunk associated with the candidate data chunk entropy limit to a specific target data chunk associated with the target data chunk entropy limit to determine if the specific candidate data chunk and the specific target data chunk are identical.