The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Nov. 21, 2019
Applicant:
Vmware, Inc., Palo Alto, CA (US);
Inventors:
Daniel Muller, Palo Alto, CA (US);
Andrei Warkentin, Cambridge, MA (US);
Assignee:
VMware, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/26 (2006.01); G06F 9/4401 (2018.01); G06F 11/22 (2006.01); G06F 11/07 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/26 (2013.01); G06F 9/4401 (2013.01); G06F 11/0793 (2013.01); G06F 11/2205 (2013.01); G06F 11/2215 (2013.01); G06F 11/2284 (2013.01); G06F 11/3065 (2013.01);
Abstract
Negative path testing in a bootloader environment can include backing up a global state of a component under test, injecting a fault to trigger an error in the component under test in a bootloader environment, executing error handling instructions until a checkpoint of the component under test in the bootloader environment is reached, restoring the global state to the component under test from the backup, and restarting the component under test.
Muller, Daniel. (2021). Negative path testing in a bootloader environment (U.S. Patent No. 11138084). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11138084
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile