The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Jun. 04, 2019
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventor:

Martin Bischoff, Großhelfendorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0751 (2013.01);
Abstract

Provided is a method and corresponding unit for analyzing a cause of at least one deviation, having the steps of: receiving a state data record which has at least one deviation; determining at least one preceding state data record; determining at least one alternative preceding state data record based on the at least one preceding state data record; determining at least one simulated data record by simulating the at least one alternative preceding state data record; comparing the at least one simulated data record with the state data record to be analyzed; determining a similarity value between the at least one simulated data record and the state data record; outputting the at least one simulated data record of the at least one alternative preceding state data record as the cause of the at least one deviation or at least one error message on the basis of the similarity value.


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