The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Nov. 05, 2019
Applicants:

Sankar Narayanan, Bengaluru, IN;

Santosh B. Narasimhachary, Charlotte, NC (US);

Kai Kadau, Lake Wylie, SC (US);

Sachin R. Shinde, Oviedo, FL (US);

Inventors:

Sankar Narayanan, Bengaluru, IN;

Santosh B. Narasimhachary, Charlotte, NC (US);

Kai Kadau, Lake Wylie, SC (US);

Sachin R. Shinde, Oviedo, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); F01D 21/00 (2006.01); G01N 25/72 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0283 (2013.01); F01D 21/003 (2013.01); G01N 25/72 (2013.01); G05B 23/0254 (2013.01);
Abstract

A method for estimating life of a component includes obtaining fracture data corresponding to a component. The fracture data includes a first dataset corresponding to a threshold region where the crack in the component is dormant below a fatigue threshold. The method further includes determining initial estimates of parameters of a crack growth rate model and parameters of temperature models corresponding to the crack growth rate model based on the fracture data. The method also includes computing optimized parameters of temperature models corresponding to the crack growth rate model, and a scatter parameter via simulation of a joint optimization method using the initial estimates. The method includes determining a cumulative distribution function based on the optimized parameters and the scatter parameter and estimating life of the component based on the cumulative distribution function.


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