The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Nov. 08, 2017
Hitachi, Ltd., Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
In order to realize stable quality control, provided is a quality control device () having an input device which receives data such as an operation condition of each device () to () in a production system () for producing a product; a calculation unit which assigns a value of the operation condition to a correlation formula calculated in advance and calculates a value derived from the correlation formula; and a determination unit which performs good or bad determination on a quality of a workpiece in each process, on the basis of a result calculated by the calculation unit. Further, when 'bad' is determined as a result of the good or bad determination, the quality control device () calculates an appropriate value of the operation condition and sets the value to each device () to ().