The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Feb. 01, 2019
Applicant:

Fairfield Industries, Inc., Sugar Land, TX (US);

Inventors:

William Aeppli Schneider, Jr., Sugar Land, TX (US);

Paul Docherty, Richmond, TX (US);

Araz Mahdad, Sugar Land, TX (US);

Assignee:

FAIRFIELD INDUSTRIES, INC., Sugar Land, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/36 (2006.01); G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
G01V 1/308 (2013.01); G01V 1/282 (2013.01); G01V 1/364 (2013.01); G01V 1/366 (2013.01); G01V 2210/3246 (2013.01); G01V 2210/51 (2013.01);
Abstract

Systems and methods of performing a seismic survey are described. The system can receive seismic data. The system receives seismic data from one or more seismic data sources. The system propagates the seismic data forward in time through a subsurface model to generate a first wavefield. The system propagates the seismic data backward in time through the subsurface model to generate a second wavefield. The system combines the first wavefield with the second wavefield using a time gate imaging condition to produce subsurface images and image gathers.


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