The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

May. 15, 2020
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Adrian Bampton, Abingdon, GB;

Stephan Biber, Erlangen, DE;

Adam Paul Johnstone, Thame, GB;

Jürgen Nistler, Erlangen, DE;

Andreas Potthast, Erlangen, DE;

Markus Vester, Nuremberg, DE;

Andre de Oliveira, Uttenreuth, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/58 (2006.01); A61B 5/055 (2006.01); G01R 33/54 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/58 (2013.01); A61B 5/055 (2013.01); G01R 33/543 (2013.01); G01R 33/5608 (2013.01);
Abstract

A calibration method for calibrating a measuring element for determining an electric current flowing through a basic-field magnet of a magnetic resonance imaging system includes performing a measurement with the measuring element, and performing a frequency measurement in the magnetic field of the basic-field magnet with a frequency measuring unit. The measurement of the measuring element and the frequency measurement are corresponding to the same magnetic field of the basic-field magnet. The calibration method also includes calculating a calibration factor based on a deviation between the measurement with the measuring element and the frequency measurement, and calibrating the measuring element or the electric current in the basic-field magnet based on the calibration factor.


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