The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Mar. 01, 2018
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Daniel Ennis, Manhattan Beach, CA (US);

Eric Aliotta, Los Angeles, CA (US);

Kevin Moulin, Los Angeles, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/563 (2006.01); A61B 5/055 (2006.01); G01R 33/54 (2006.01); G01R 33/561 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56341 (2013.01); A61B 5/055 (2013.01); G01R 33/543 (2013.01); G01R 33/5616 (2013.01); G01R 33/56518 (2013.01);
Abstract

A system and method for optimized diffusion-weighted imaging is provided. In one aspect, the method includes providing a plurality of constraints comprising an eddy current constraint for imaging a target at a selected diffusion weighting, and applying an optimization framework to generate an optimized diffusion encoding gradient waveform satisfying the plurality of constraints. The method also includes performing, using the MRI system, a pulse sequence comprising the optimized diffusion encoding gradient waveform to generate diffusion-weighted data, and generating at least one image of the target using the diffusion-weighted data.


Find Patent Forward Citations

Loading…