The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Oct. 30, 2019
Applicant:

Nippon Mektron, Ltd., Tokyo, JP;

Inventors:

Shoji Takano, Tokyo, JP;

Fumihiko Matsuda, Tokyo, JP;

Yoshihiko Narisawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/073 (2006.01); H01R 12/71 (2011.01);
U.S. Cl.
CPC ...
G01R 31/2808 (2013.01); G01R 1/07364 (2013.01); H01R 12/714 (2013.01); H01R 2201/20 (2013.01);
Abstract

Provided is a probe device used for electrical inspection of a printed wiring board, the probe device including at least one probe group including a plurality of wire probes configured to be able to simultaneously abut against a wire provided on the printed wiring board and extending in a specified direction, the plurality of wire probes abutting against the wire along the direction and being electrically connected to each other.


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