The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Nov. 25, 2019
System and method for parallel measurement of devices under test in an open over the air environment
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 17/20 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 17/20 (2013.01); G01R 1/04 (2013.01);
Abstract
A system for parallel measurement of devices under test in an open over the air environment is provided. The system comprises a plurality of alignment structures, each comprising a shaped reflector arranged at a top end of the alignment structure and an antenna arranged at the focal region of the shaped reflector. In this context, the devices under test are arranged at bottom ends of the plurality of alignment structures, opposite to a respective shaped reflector. In addition, the plurality of alignment structures are placed parallel to each other without shielded enclosures.