The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Dec. 10, 2019
Applicant:

Covestro Llc, Pittsburgh, PA (US);

Inventor:

Steven G. Owens, Sewickley, PA (US);

Assignee:

Covestro LLC, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/18 (2006.01); G01N 27/18 (2006.01); G01K 17/20 (2006.01);
U.S. Cl.
CPC ...
G01N 25/18 (2013.01); G01N 27/18 (2013.01); G01K 17/20 (2013.01);
Abstract

Methods for measuring long-term thermal resistance of closed-cell foam. The methods include: (a) placing a stack of slices cut from a sample of the foam between two isothermal plates in a calibrated heat flow meter comprising a heat flux transducer; (b) measuring an initial thermal resistance of the same stack of slices at a plurality of preselected mean temperatures within the temperature range of 10° F. to 150° F. wherein the stack of foam slices stays inside the heat flow meter throughout step (b); (c) at a time calculated to represent a selected aging period of the foam, placing the same stack of slices between two isothermal plates in a calibrated heat flow meter and measuring the thermal resistance of the stack of slices at a plurality of preselected mean temperatures within the temperature range of 10° F. to 150° F. wherein the stack of foam slices stays inside the heat flow meter throughout the measuring portion of step (c); and (d) calculating the long-term thermal resistance of the foam at each of the plurality of preselected mean temperatures.


Find Patent Forward Citations

Loading…