The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Nov. 02, 2018
Applicant:

Sela Solutions Enabling Nano Analytics Ltd., Yokneam, IL;

Inventors:

Vladimir Zheleznyak, Qiryat Motzkin, IL;

Anatoli Eizner, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); B28D 5/00 (2006.01); H01L 21/67 (2006.01); G06T 7/00 (2017.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); B28D 5/0005 (2013.01); B28D 5/0023 (2013.01); B28D 5/0064 (2013.01); B28D 5/0082 (2013.01); G01N 21/9505 (2013.01); G06T 7/0004 (2013.01); H01L 21/67288 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A method for exposing a buried defect, the method may include illuminating, by a radiation source, an object that comprises the buried defect, with illuminating radiation that passes through radiation transparent part of a chuck, while the object is supported by the chuck; detecting, by a sensor, a detected radiation that passed through the object, to provide a visual indication about the buried defect, wherein the visual indication is indicative of a location of the buried defect; setting, based on the location of the buried object and a spatial relationship between a cleaving element and the sensor, a cleaving axis of a cleaving element to virtually cross the buried defect; and cleaving, by the cleaving element, the object to expose the buried object.


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