The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Feb. 16, 2017
Broadley-james Corporation, Irvine, CA (US);
William E. Reynolds, IV, Irvine, CA (US);
Robert J. Garrahy, Laguna Niguel, CA (US);
Jared H. Nathanson, Mission Viejo, CA (US);
Bradley Joseph Sargent, Mission Viejo, CA (US);
Scott T. Broadley, Laguna Beach, CA (US);
BROADLEY-JAMES CORPORATION, Irvine, CA (US);
Abstract
Methods and apparatus for reducing measurement artifacts of sensor measurements are disclosed herein. An aspect of the invention includes a measurement device configured to reduce measurement inaccuracies in a sample. The measurement device comprises a measurement probe comprising a sensor configured to detect a characteristic of the sample and generate a measurement signal based thereon. The measurement device further comprises a memory configured to store instructions for applying a filter to the measurement signal. The measurement device also further comprises a filtering module configured to process the instructions for applying the filter to the measurement signal to generate a filtered output with reduced measurement inaccuracies.