The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Sep. 29, 2017
Applicant:

Sol Inc., Seoul, KR;

Inventors:

Jong Muk Lee, Seoul, KR;

Seong Won Kwon, Boeun-gun, KR;

Ki Ho Jang, Seongnam-si, KR;

Jung Joon Ahn, Uijeongbu-si, KR;

Tae Young Lee, Asan-si, KR;

Assignee:

SOL INC., Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01); H04N 5/374 (2011.01); G01N 27/414 (2006.01); G01N 21/17 (2006.01); G01F 1/00 (2006.01); G06F 17/16 (2006.01); G06F 17/18 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0826 (2013.01); G01F 1/00 (2013.01); G01N 15/08 (2013.01); G01N 21/17 (2013.01); G01N 27/414 (2013.01); G06F 17/16 (2013.01); G06F 17/18 (2013.01); H04N 5/374 (2013.01); G01N 2015/086 (2013.01); G01N 2021/8444 (2013.01);
Abstract

Provided is a method for evaluating fluid flow characteristics of a lens-free complementary metal-oxide semiconductor (CMOS) optical sensor package module with a flow channel. The method includes: measuring a propagation profile and a flow velocity in an initial state flow of a fluid in the flow channel; calculating a first statistical parameter relating to flow characteristics of the fluid from the measured propagation profile and flow velocity; and comparing the calculated first statistical parameter with a preset reference value and evaluating quality of the flow channel according to the comparison result.


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