The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Nov. 12, 2018
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Toshiba Memory Corporation, Minato-ku, JP;
Sai Prem Kumar Ayyagari, Karnataka, IN;
Arun Kumar Kalakanti, Karnataka, IN;
Topon Paul, Kawasaki, JP;
Shigeru Maya, Yokohama, JP;
Takeichiro Nishikawa, Yokohama, JP;
KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;
Toshiba Memory Corporation, Minato-ku, JP;
Abstract
A method and system for detecting anomalies in waveforms in an industrial plant. During a learning stage, one or more training waveforms are received from sensors monitoring a plurality of equipment in the industrial plant. The one or more training waveforms are used to generate a representative waveform and deviations of the one or more training waveforms from the representative waveform are determined. Based on the deviations, groups are created. A model may be associated with each group for building an expected waveform pattern. When test waveforms are received, based on the electrical and physical properties of the test waveforms, each test waveform is classified into one of the groups. Thereafter, each waveform is compared with the expected waveform pattern associated with the group to which the respective test waveform belongs, to detect the anomaly.