The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Jul. 09, 2018
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventors:

Ion Matei, Sunnyvale, CA (US);

Aleksandar B. Feldman, Santa Cruz, CA (US);

Johan de Kleer, Los Altos, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 13/00 (2019.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G01M 13/00 (2013.01); G05B 23/0254 (2013.01);
Abstract

One embodiment can provide a method and a system for diagnosing faults in a physical system. During operation, the system obtains a time-domain model of the physical system and converts the time-domain model to the frequency domain to obtain a frequency-domain model of the physical system. The time-domain model can include one or more model parameters having known values. The system also obtains time-domain input and output signals and converts the time-domain input and output signals to the frequency domain to obtain frequency-domain input and output signals. The system identifies at least one model parameter having an expected value that is different from a known value of the at least one model parameter based on the frequency-domain model and the frequency-domain input and output signals, and generates a diagnostic output indicating at least one component within the physical system being faulty based on the identified at least one model parameter.


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