The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Nov. 07, 2017
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Hiroshi Ota, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01J 3/02 (2006.01); G01N 21/65 (2006.01); G01N 21/552 (2014.01);
U.S. Cl.
CPC ...
G01J 3/44 (2013.01); G01J 3/0205 (2013.01); G01N 21/65 (2013.01); G01N 21/552 (2013.01);
Abstract

An accessory for an infrared spectrophotometer is provided in which both an infrared spectrum and a Raman spectrum at the same measurement position of a sample can be easily acquired. By incorporating an infrared optical system and an excitation light source into the accessory for an infrared spectrophotometer, infrared light from an infrared light source of the infrared spectrophotometer and excitation light from the excitation light source provided for the accessory are guided to the same measurement position P in the sample S. A total reflection spectrum is acquired by detecting the totally reflected light from the sample S irradiated with the infrared light by an infrared detector of the infrared spectrophotometer. Raman scattered light from the sample S irradiated with the excitation light is detected by a Raman detector provided in the accessory. By incorporating the accessory into the infrared spectrophotometer and measuring the sample S, both the infrared spectrum (total reflection spectrum) and the Raman spectrum at the same measurement position P of the sample S can be easily acquired.


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