The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Jul. 10, 2018
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Andreas Barbul, Munich, DE;

Wolfgang Pahl, Munich, DE;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/5712 (2012.01); G01C 19/5719 (2012.01); B81B 7/02 (2006.01); G01P 15/08 (2006.01); G01P 15/18 (2013.01);
U.S. Cl.
CPC ...
G01C 19/5719 (2013.01); B81B 7/02 (2013.01); G01C 19/5712 (2013.01); G01P 15/0802 (2013.01); G01P 15/18 (2013.01); B81B 2201/0235 (2013.01); B81B 2201/0242 (2013.01);
Abstract

A method for measuring a behavior of a MEMS device is disclosed. In an embodiment a method includes mounting the MEMS device to a testing apparatus that comprises a vibration source, wherein the MEMS device comprises a 6-axis or 9-axis inertial sensor, applying a vibration to the MEMS device by the vibration source and simultaneously moving the testing apparatus according to a predefined movement pattern, reading output data provided by the inertial sensor and comparing the output data to the predefined movement pattern and/or reading output data provided by the inertial sensor and calculating a frequency response curve of the inertial sensor.


Find Patent Forward Citations

Loading…