The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Nov. 13, 2017
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Xavier Quintero Ruiz, Sant Cugat del Valles, ES;

Raul Rodriguez Alonso, Sant Cugat del Valles, ES;

Montserrat Solano Pallarol, Sant Cugat del Valles, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01);
U.S. Cl.
CPC ...
B41J 2/04505 (2013.01); B41J 2/0458 (2013.01); B41J 2/04581 (2013.01);
Abstract

Certain examples describe a method of calibrating a printer and a printing system. An interferential pattern is printed in the form of a print calibration image on a print medium. Data representative of the interferential pattern as printed on the print medium is detected using an optical sensor. The printer is calibrated based on the captured data. The interferential pattern is based on a waveform that varies in amplitude along an axis perpendicular to a printing axis under calibration and has repeated sets of multiple patterns based on the waveform, the repeated sets having a varying pattern spacing in the printing axis under calibration.


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