The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Dec. 01, 2017
Applicant:

Toyokoh Co., Ltd., Fuji, JP;

Inventors:

Hiroyasu Toyosawa, Fuji, JP;

Kazuaki Toyosawa, Fuji, JP;

Kazuhisa Fujita, Hamamatsu, JP;

Shinichiro Okihara, Hamamatsu, JP;

Assignee:

TOYOKOH, Co., Ltd., Fuji, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/36 (2014.01); B08B 7/00 (2006.01); B23K 26/00 (2014.01); B01J 19/12 (2006.01); B23K 26/16 (2006.01); B23K 26/402 (2014.01); B23K 26/04 (2014.01); B23K 26/06 (2014.01); B23K 26/08 (2014.01); B23K 26/14 (2014.01); B23K 26/064 (2014.01); B23K 26/082 (2014.01); B23K 26/035 (2014.01); B23K 103/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/36 (2013.01); B01J 19/12 (2013.01); B08B 7/0035 (2013.01); B23K 26/00 (2013.01); B23K 26/0006 (2013.01); B23K 26/037 (2015.10); B23K 26/04 (2013.01); B23K 26/06 (2013.01); B23K 26/064 (2015.10); B23K 26/08 (2013.01); B23K 26/082 (2015.10); B23K 26/0869 (2013.01); B23K 26/14 (2013.01); B23K 26/16 (2013.01); B23K 26/402 (2013.01); B23K 2103/56 (2018.08);
Abstract

In order to provide a laser irradiation system, a method for removing a coating, and a laser irradiation apparatus capable of efficiently removing a coating on a surface of a structure and recovering the removed substance using suction, a laser head () is configured from an optical system () for irradiating laser beam (), a suctioning means () for suctioning removed matter () produced at the point where the laser beam () is directed, and an attachment () configured to be capable of abutting a surface () of a structure, the optical system () being operated to scan the irradiation point of the laser beam so as to draw a trajectory of a circle having a radius raround the optical axis of the laser beam () on a surface substantially perpendicular to the optical axis.


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