The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Feb. 05, 2020
General Electric Company, Schenectady, NY (US);
Xue Rui, Niskayuna, NY (US);
Mingye Wu, ShangHai, CN;
Yannan Jin, Niskayuna, NY (US);
Peter Michael Edic, Niskayuna, NY (US);
Bruno Kristiaan Bernard De Man, Niskayuna, NY (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials; obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object; estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity; and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.