The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Dec. 04, 2019
Nanjing Agricultural University, Jiangsu, CN;
Jinfeng Chen, Jiangsu, CN;
Ji Li, Jiangsu, CN;
Qunfeng Lou, Jiangsu, CN;
Chuntao Qian, Jiangsu, CN;
Kaijing Zhang, Jiangsu, CN;
Chunyan Cheng, Jiangsu, CN;
Xiaqing Yu, Jiangsu, CN;
NANJING AGRICULTURAL UNIVERSITY, Nanjing, CN;
Abstract
The present invention discloses a breeding method and application of a new downy mildew-resistant interspecific hybridvariety. The breeding method comprises the following steps: performing hybridization to obtain F1 with the high-generation inbred line CCMC of 'Changchun dense thorn' as a female parent and a-introgression line material IL52 as a male parent, selfing the hybrid F1 to obtain F2, and continuously constructing an F6 recombinant inbred line by the single seed transfer method; and by identifying of phenotypes of the recombinant inbred line populations during the natural inoculation of downy mildew at the adult plant stage in the field for 4 years, recombinant individuals with high resistance and good fruit marketability will be screened; and utilizing backcrossing and molecular marker-assisted selection to obtain the individuals as the new downy mildew-resistant interspecific hybridvariety in which the genotype in the dm5.2 region coincides with the banding pattern of IL52 and the other chromosome regions are the banding pattern of 'Changchun dense thorn'. The new variety has a high downy mildew-resistant trait, high yield and excellent fruit quality.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile