The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Mar. 23, 2020
Roku, Inc., Los Gatos, CA (US);
Taiquan Lu, San Jose, CA (US);
Steve ShawJong Liu, Mountain View, CA (US);
Roku, Inc., San Jose, CA (US);
Abstract
On-demand, post-production de-mura of a television is described herein. An example system includes a television that comprises a screen and a local de-mura application. The system also includes a mobile device that comprises a mobile de-mura module. In operation, the mobile de-mura module identifies and quantifies mura in the screen of the television for a given IRE index. These operations are repeatedly performed in a measurement loop that iterates over a range of IRE indexes. Raw uniformity data is generated from such iterations. The local de-mura application uses the uniformity data to de-mura the screen and improve gray uniformity performance of the television. Further, the mobile de-mura module and the local de-mura application are configured to fine tune and further de-mura the screen by iterating a verification loop over a range of IRE indexes, wherein operation of the verification loop is substantially similar to operation of the measurement loop.