The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Dec. 15, 2017
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Charles Jia, San Diego, CA (US);

Jackie Shi Chung Fung, San Diego, CA (US);

Kevin A Merrill, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/387 (2006.01);
U.S. Cl.
CPC ...
H04N 1/3878 (2013.01);
Abstract

According to examples, an apparatus may include a processor and a memory on which is stored machine readable instructions executable by the processor to detect edges of a scanned object image. The instructions may also cause the processor to determine, based on the detected edges, that a feed skew has occurred on the scanned object image. In addition, based on a determination that the feed skew has occurred, the instructions may cause the processor to identify curved edges of the scanned object image, de-curve the identified curved edges through horizontal scanline scaling of the scanned object image to form a de-curved image, and produce a corrected image through vertical scanline scaling of the de-curved image.


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