The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11133955 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 28, 2021

Filed:

Aug. 29, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Zachary A. Silverstein, Austin, TX (US);

Jacob Ryan Jepperson, Austin, TX (US);

Frank Eduardo Chavez, Lima, PE;

Sarbajit K. Rakshit, Kolkata, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/28 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 12/2825 (2013.01); H04L 43/50 (2013.01); H04L 2012/285 (2013.01);
Abstract

System and methods for testing smart device functions within a smart environment are disclosed. In embodiments, a method includes accessing test case data that associates one or more smart device commands with an event type based on historic event data from a plurality of participating smart environments; determining a test case for the event type based on the test case data, wherein the test case is configured to initiate a test of a smart device command of a smart device within a smart environment of a participant; determining that the test case can be initiated at the smart environment based on rules and participant data indicating a location of the participant with respect to the smart environment; and initiating execution of the test case by a smart device controller of the smart environment, wherein the execution causes the smart device controller to test the smart device command.


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