The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

May. 05, 2020
Applicants:

Michael S. Larsen, Woodland Hills, CA (US);

Thad G. Walker, Middleton, WI (US);

Justin M. Brown, Harvard, MA (US);

Inventors:

Michael S. Larsen, Woodland Hills, CA (US);

Thad G. Walker, Middleton, WI (US);

Justin M. Brown, Harvard, MA (US);

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/00 (2006.01); G01C 21/24 (2006.01);
U.S. Cl.
CPC ...
G21K 1/006 (2013.01); G01C 21/24 (2013.01);
Abstract

An atom interferometer system includes a sensor cell comprising alkali metal atoms. An optical system generates first and second interrogation beams having respective first and second frequencies and a circular polarization. The optical system includes optics that provide the first and second interrogation beams through the sensor cell in a first direction and reflect the first and second interrogation beams back through the sensor cell in a second direction opposite the first direction and in a same circular polarization to drive the alkali metal atoms from a first energy state to a greater energy state during an interrogation stage of sequential measurement cycles. A detection system detects a state distribution of a population of the alkali metal atoms between the first energy state and the second energy state during the interrogation stage based on an optical response.


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