The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Jun. 25, 2020
Applicant:

Li-cor, Inc., Lincoln, NE (US);

Inventor:

Patrick G. Humphrey, Lincoln, NE (US);

Assignee:

LI-COR, Inc., Lincoln, NE (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 10/40 (2018.01); G06K 9/32 (2006.01); G16H 30/40 (2018.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G16H 10/40 (2018.01); G06K 9/3233 (2013.01); G06T 7/0012 (2013.01); G16H 30/40 (2018.01); G06T 2207/10072 (2013.01);
Abstract

Systems and methods for automatically identifying and characterizing one or more lanes in image data for one or more electrophoresed samples. The method includes receiving data representing an image of one or more electrophoresed samples, segmenting the data into one or multiple data segments or portions within a region of interest (ROI), wherein the one or multiple data segments represent (e.g., when visually displayed) one or multiple lane segments along a first axis in the ROI, each of the one or multiple lane segments traversing one or multiple lanes in the image data, generating an intensity profile for at least a first data segment of the one or multiple data segments along a second axis orthogonal to the first axis, and processing the intensity profile to determine a location and parameters for each of one or multiple lanes in the first data segment.


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