Instant and permanent self-destruction method in 3d nand for data security purpose

Abstract

Apparatuses and techniques are described for performing an operation which irreversibly prevents access to a set of memory cells. The operation provides a strong erase bias for select gate transistors of NAND strings. The erase bias induces a phenomenon in the select gate transistors which permanently increases their threshold voltages. This prevents access to the memory cells such as for program or read operations. The operation can involve one or more erase-verify iterations. In each erase-verify iteration, an erase bias is applied to the select gate transistors such as by charging up the channels of the NAND strings and holding a control gate voltage of the select gate transistors at a relatively low level, thereby causing a relatively high channel-to-control gate voltage.