The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Mar. 29, 2017
Nec Corporation, Tokyo, JP;
Yosuke Iwamatsu, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
The present invention reduces the amount of data outputted while maintaining the accuracy of an analysis process with a small delay amount, by an image analysis apparatus provided with: a deduction unit that deduces a second quality concerning an object in a second image, which is different from a first image associated with object data relating to an object to be inputted, on the basis of a first quality concerning the object relating to the object data and on the basis of the state of the object in the second image, the state being obtained by using a state model for deducing the position and the size of the object from the object data, while using a quality model for deducing the second quality concerning the object; and a determination unit that determines whether to use the object data for analysis on the basis of the deduced second quality.