The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11132616 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 28, 2021

Filed:

Mar. 17, 2017
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Mikito Iwamasa, Tokyo, JP;

Takuro Moriyama, Kanagawa, JP;

Tomoshi Otsuki, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06N 20/00 (2019.01); G06N 20/10 (2019.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 20/00 (2019.01); G06N 20/10 (2019.01); G05B 19/41885 (2013.01);
Abstract

A characteristic value estimation device has a sensor data input unit to input sensor data detected by one or more sensors, a model input unit to input a first calculation model, a model learning unit to perform learning on a second calculation model, a model switch to select any one of the first calculation model and the second calculation model, a predictive value calculation unit to calculate an error of the calculation model, a probability distribution correction unit to correct the probability distribution of the uncertain parameter, a virtual sensor value estimation unit to estimate sensor data of a virtual sensor arranged virtually, a characteristic value distribution estimation unit to estimate a detailed distribution of the characteristic value, the sensor data of the virtual sensor, and the sensor data of the sensor, and a reliability calculation unit to calculate a reliability of the precise characteristic value distribution.


Find Patent Forward Citations

Quick Actions:

Iwamasa, Mikito. (2021). Characteristic value estimation device and characteristic value estimation method (U.S. Patent No. 11132616). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11132616

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…