The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Apr. 26, 2018
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Avitan Gefen, Tel Aviv, IL;

Omer Sagi, Mazkeret Batya, IL;

Ran Taig, Beer Sheva, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06N 20/00 (2019.01); G06F 11/3668 (2013.01);
Abstract

Techniques are provided for data-driven scheduling of automated software program test suites. An exemplary method comprises: obtaining a plurality of test cases that test software programs; obtaining a failure likelihood for each of the plurality of test cases; and scheduling the test cases in an order based on the failure likelihoods. Generally, test cases that are more likely to fail are scheduled before test cases that are less likely to fail. Dependencies and/or priorities among the plurality of test cases are also optionally obtained and the scheduling of the test cases is based on the dependencies and/or priorities. The dependencies among the plurality of test cases comprise, for example, an indication of whether a given test case constrains one or more additional test cases.


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