The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Apr. 16, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Deborah A. Furman, Staatsburg, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A computer-implemented method for testing a system under test (SUT) in an active environment includes generating multiple test cases. The method further includes executing, by the testing system, a first set of test cases from those generated, and determining a test case that failed. Further a code path that is exercised by the test case is detected, the code path having a defect. The method further includes identifying, by the testing system, a second set of test cases from the test cases that are generated, wherein each test case from the second set of test cases has not been executed and exercises the code path that is identified. The method further includes reordering, by the testing system, at runtime, the test cases to omit execution of the second set of test cases.