The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Jun. 21, 2019
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Guangwei Cheng, Shenzhen, CN;

Bo Shang, Shenzhen, CN;

Tian Qi, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); G06F 16/27 (2019.01); G06F 16/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/1469 (2013.01); G06F 11/14 (2013.01); G06F 11/1451 (2013.01); G06F 16/00 (2019.01); G06F 16/273 (2019.01); G06F 2201/80 (2013.01); G06F 2201/82 (2013.01);
Abstract

Embodiments of this application provide a method and an apparatus for multi-replica data restoration. The method is applied to a distributed database and includes: when a first page in replica data of a first node has a fault, obtain N latest LSNs in data log information of a second node that corresponds to a first page identifier. The first page is any page that is in the replica data of the first node and that has a fault. The first node further determines a node corresponding to a largest LSN in the N latest LSNs in the data log information of the second node that corresponds to the first page identifier is a third node. Then the first node performs data restoration on the first page in the replica data of the first node according to replica data of the third node.


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