The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Nov. 04, 2019
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Jianwu Xu, Titusville, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/0769 (2013.01); G06F 11/0772 (2013.01); G06F 11/0778 (2013.01); G06F 11/0784 (2013.01); G06K 9/6256 (2013.01);
Abstract

A method for implementing automated information technology (IT) system failure recommendation and mitigation includes performing log pattern learning to automatically generate sparse time series for each log pattern for a set of classification logs corresponding to a failure, performing multivariate log time series extraction based on the log pattern learning to generate a failure signature for the set of classification logs, including representing the sparse time series as a run-length encoded sequence for efficient storage and computation, calculating a similarity distance between the failure signature for the set of classification logs and each failure signature from a failure signature model file, determining a failure label for the failure corresponding to a most similar known failure based on the similarity distance, and initiating failure mitigation based on the failure label.


Find Patent Forward Citations

Loading…