The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2021
Filed:
Jul. 31, 2019
Hamilton Sundstrand Corporation, Charlotte, NC (US);
Yanzhi Chen, Shanghai, CN;
Ranadip Acharya, Rocky Hill, CT (US);
Tahany I. El-Wardany, Vernon, CT (US);
Colette O. Fennessy, West Hartford, CT (US);
William K. Tredway, Manchester, CT (US);
Hamilton Sundstrand Corporation, Charlotte, NC (US);
Abstract
A spatial difference measurement method, can include generating first key features of a first skeleton of a nominal 3D model of an object and extrapolating the first key features onto the nominal 3D model. The method can include creating an actual 3D model of the object during or after a construction process (real or simulated). The method can include generating second key features of a second skeleton of the actual 3D model of the object and extrapolating the second key features onto the actual 3D model of the object. The method can include comparing the first key features extrapolated on the nominal 3D model to the second key features extrapolated on the actual 3D model to determine one or more distances between the first and second key features to measure a spatial difference between the nominal 3D model and the object during or after construction.