The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Mar. 19, 2019
Applicant:

Tsinghua University, Beijing, CN;

Inventors:

Qionghai Dai, Beijing, CN;

Zhi Lu, Beijing, CN;

Jiamin Wu, Beijing, CN;

Assignee:

TSINGHUA UNIVERSITY, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/22 (2006.01); G02B 21/36 (2006.01); H04N 13/106 (2018.01); H04N 13/207 (2018.01);
U.S. Cl.
CPC ...
G02B 21/361 (2013.01); G02B 21/365 (2013.01); H04N 13/106 (2018.05); H04N 13/207 (2018.05);
Abstract

A scanning light field microscopic imaging system includes: a microscope configured to magnify a sample and image the sample onto a first image plane of the microscope; a relay lens configured to magnify or minify the first image plane; a 2D scanning galvo configured to rotate an angle of a light path in the frequency domain plane; the microlens array configured to modulate a beam with a preset angle to a target spatial position at a back focal plane of the microlens array and modulate the first image plane to obtain a modulated image; an image sensor configured to record the modulated image; and a reconstruction module configured to reconstruct a 3D structure of the sample based on the modulated image acquired from the image sensor.


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